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1. SPR Phase Detection for Measuring the Thickness of Bimetallic Layers' Film | |||
Liu Chao,Yue Chong,Qin Zirui,Liu Qinggang | |||
Physics 13 January 2018 | |||
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Abstract:In this paper, the phase detection method is demonstrated to determine the films thicknesses of bimetallic layers by Surface Plasmas Resonance (SPR) prism coupler. It was proposed and developed by matching the experimental results to the theoretical curves of the phase difference with different angles of incidence. Theoretical analysis and experimental results indicate that the method proposed is stable and reliable, and feasible to be used to determine the film thickness of bimetallic layers directly with nanometer order resolution. | |||
TO cite this article:Liu Chao,Yue Chong,Qin Zirui, et al. SPR Phase Detection for Measuring the Thickness of Bimetallic Layers' Film[OL].[13 January 2018] http://en.paper.edu.cn/en_releasepaper/content/4743064 |
2. Inverse source model for nonparaxial diode lasers | |||
Cao Changqing ,Zeng Xiaodong ,An Yuying | |||
Physics 27 March 2006 | |||
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Abstract:Based on the off-axis theory and a far-field rigorous solution of the Helmholtz equation, by using the angular spectrum representation, the Fourier transform and the inverse Fourier transform, an inverse source model for nonparaxial diode lasers has been obtained. This model has a simple mathematical structure and can be easily used to solve the inverse source problem rigorously with the far-field measured data. So the accurate analytical solution to the source distribution can be obtained with the far-field intensity distribution, and then the parameters relating to the waveguide structure can be obtained. | |||
TO cite this article:Cao Changqing ,Zeng Xiaodong ,An Yuying . Inverse source model for nonparaxial diode lasers[OL].[27 March 2006] http://en.paper.edu.cn/en_releasepaper/content/5933 |
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