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Fused method of fault diagnosis for analog circuits
Tan Yanghong 1 #,He Yigang 2 * #,Ye Jiazhuo 1,Chen Wuli 1
1.Hunan University
2.HunanUniversity
*Correspondence author
#Submitted by
Subject:
Funding: none
Opened online:29 November 2005
Accepted by: none
Citation: Tan Yanghong,He Yigang,Ye Jiazhuo.Fused method of fault diagnosis for analog circuits[OL]. [29 November 2005] http://en.paper.edu.cn/en_releasepaper/content/3839
 
 
A fused fault diagnosis method based on wavelet packet decomposition of voltages of test nodes and current signals of terminals stimulated is proposed in the paper. For the faults difficult to detect merely from voltages of test nodes, the current signals of the terminals which contain sufficient information with various faults are fused with the sampled node voltages of the circuit stimulated by the sources selected according to the principles proposed to make up for the insufficiency of the node voltages resulting in maximization feature vectors and correctly identifying the fuzzy sets of faults. So higher correct classification to the faults of circuits is obtained.
Keywords:analog circuits; fault diagnosis; current test; fused
 
 
 

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