Infrared light transport properties of nanostructure vanadium dioxide thin films across metal-insulator

LIANG Jiran; LIU Xing; HU Ming; LI Na; WU Maijun

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Infrared light transport properties of nanostructure vanadium dioxide thin films across metal-insulator

LIANG Jiran * #,LIU Xing,HU Ming,LI Na,WU Maijun

School of Electronic Information Engineering, Tianjin University, Tianjin 300072

*Correspondence author

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Funding: This research was financially supported by the National Natural Science Foundation of China （No.No. 61101055) and the research Fund of Poctoral Program of Higher Education of Chin）

Opened online:11 December 2013

Accepted by: none

Citation: LIANG Jiran,LIU Xing,HU Ming.Infrared light transport properties of nanostructure vanadium dioxide thin films across metal-insulator[OL]. [11 December 2013] http://en.paper.edu.cn/en_releasepaper/content/4572629

A nano-structured Vanadium dioxide thin film has been fabricated through reactive magnetron sputtering followed thermal annealing. X-ray diffraction and scanning electron microscope were used to analysis the crystalline structure and morphology of annealed thin film, respectively. The infrared light transport properties of nano-structured vanadium dioxide thin film were characterized by transmittance determined by Fourier transform infrared spectrometry during phase transition. The results show that the onset temperature of transition increases with wavelength. The maximum transmittance shifts to longer wavelength as the phase changed from insulating phase to metallic phase. The transmittance at shorter wavelength exhibits an increasing at the beginning of metal-insulator transition. The infrared light transport properties are related to the interaction of infrared light and vanadium dioxide nano-grain during metal-insulator transition.

Keywords:vanadium dioxide thin film; metal-insulator transition; infrared optical transition

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