Check out RSS, or use RSS reader to subscribe this item
Confirmation
Authentication email has already been sent, please check your email box: and activate it as soon as possible.
You can login to My Profile and manage your email alerts.
Sponsored by the Center for Science and Technology Development of the Ministry of Education
Supervised by Ministry of Education of the People's Republic of China
Halogen is always brought by the process of wet etching for fused silica devices, which dramatically influence the performance of the devices. Using ab initio quantum mechanical methods we investigate the adsorption properties for halogen atoms (F, Cl) on fused silica surface. We focus on the interaction mechanisms of halogen atoms with two main surface defects and make comparison for the absorption capacity of different surface defects. Furthermore, the electronic structure for impurity defects are also studied.