Implicit Functional testing of switched current filter based on fault signatures

Long Ying; He Yigang

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Implicit Functional testing of switched current filter based on fault signatures

Long Ying 1 * #,He Yigang 2

1.2Dept. Electronic and Communication Engineering ChangSha University

2. College of Electrical and Information Engineering HuNan University

*Correspondence author

#Submitted by

Subject:

Funding: 国家自然科学基金,国家自然科学基金,国家863计划,教育部高校博士点基金（No.NO.50677014,NO.60876022 ,NO.2006AAO4A104,NO.20060532002）

Opened online:17 September 2009

Accepted by: none

Citation: Long Ying ,He Yigang .Implicit Functional testing of switched current filter based on fault signatures[OL]. [17 September 2009] http://en.paper.edu.cn/en_releasepaper/content/35249

This paper aims at defining an efficient test strategy for switched-current circuit testing. By checking the constructed signatures (impulse response samples) against the derived tolerance ranges, we can infer the correctness of the device under test (DUT) without explicitly measuring the original performance parameters. We also describe a technique of mapping the tolerance ranges in the performance space to its associated tolerance ranges in the signature space (We call such a procedure implicit functional testing). In particular, a suitable strategy for the choice of these samples has been devised taking into account their sensitivities to the circuit performance to be checked for. Taking into account the specificity of switched-current circuit, catastrophic and parametric fault model for testing is constituted. A fifth order Butterworth low-pass filter and a sixth order Elliptic band-pass filter have been used as test benches to assess the effectiveness of the proposed technique. Test results demonstrate that a high fault coverage can be achieved with a low cost test equipments.

Keywords:Switched current;functional test;fault model;fault signatures

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