Influence of Fluoride-doped Tin Oxide Interlayer on Ni-Sb-SnO2/Ti Electrodes |
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LI Guo 1,WANG Yun-Hai 1 * #,CHEN Qing-Yun 2
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1.Department of Environmental Engineering, School of Energy and Power Engineering, Xi'an Jiaotong University, Xi'an 710049
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2.State Key Lab of Multiphase Flow and Power Engineering, Xi'an Jiaotong University, Xi'an 710049
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*Correspondence author |
#Submitted by |
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Subject: |
Funding:
Research Fund for the Doctoral Program of Higher Education of China (No.No.20090201120010), Natural Science Foundation of China (No.No.21206134)) |
Opened online:18 December 2012 |
Accepted by:
none |
Citation: LI Guo,WANG Yun-Hai,CHEN Qing-Yun.Influence of Fluoride-doped Tin Oxide Interlayer on Ni-Sb-SnO2/Ti Electrodes[OL]. [18 December 2012] http://en.paper.edu.cn/en_releasepaper/content/4500527 |