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Interface elastic field of multilayer thin foils induced by dislocation loops
Xia Re 1 * #,Wu Wenwang 2
1.School of Power and Mechanical Engineering, Wuhan University, Wuhan, 430072
2.State Key Laboratory of Automotive Safety and Energy, Tsinghua University, Beijing 100084
*Correspondence author
#Submitted by
Subject:
Funding: Specialized Research Fund of the Doctoral Program of Higher Education (No.No. 20110141120024)
Opened online:14 December 2015
Accepted by: none
Citation: Xia Re,Wu Wenwang.Interface elastic field of multilayer thin foils induced by dislocation loops[OL]. [14 December 2015] http://en.paper.edu.cn/en_releasepaper/content/4667332
 
 
A semi-analytical solution based on discrete Fast Fourier Transformation (FFT) is developed for analyzing the interface traction stress (ITS) of approaching dislocation loops within perfect bonding multi-layers. Interface elastic fields of perfect bonding multilayers are influenced by the elastic modulus mismatch and crystallographic misorientation, and then the case of perfect bonding two-layer system is elaborated in details.
Keywords:interface traction stress, isotropic, dislocation loop, multilayers
 
 
 

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