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Sponsored by the Center for Science and Technology Development of the Ministry of Education
Supervised by Ministry of Education of the People's Republic of China
Error source analysis and parameter optimization of measurement device independent quantum key distribution
GAO Feng,JIAO Rong Zhen *
School of Science, Beijing University of Posts and Telecommunications, Beijing 100876
*Correspondence author
#Submitted by
Subject:
Funding:
none
Opened online:24 December 2015
Accepted by:
none
Citation: GAO Feng,JIAO Rong Zhen.Error source analysis and parameter optimization of measurement device independent quantum key distribution[OL]. [24 December 2015] http://en.paper.edu.cn/en_releasepaper/content/4670979
Measurement device independent quantum key distribution (MDI-QKD) can remove all the side-channel attacks from imperfection in the detection side, since firstly proposed by Lo et al, it shows a great influence in the field of quantum key distribution, it has made great progress in both theory and experiment. However, error source undoubtedly influence its property. In this paper, we analyze the performance of MDI-QKD system with error sources like mode mismatch and background count rate. The simulation shows that the optimization of asymmetric case and the optimal choice of intensity of the signal state may enhance the performance of MDI-QKD system.