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Testing of Parallel Parameterized Extended Finite State Machines with Dependence on External Variables
Yao Jiangyuan 1,Zhiliang Wang 2 *,Xia Yin 3,Jianping Wu 2
1.Department of Computer Science and Technology, Tsinghua University, Beijing 100084
2. Tsinghua National Laboratory for Information Science and Technology, Beijing 100084
3.Network Research Center, Tsinghua University, Beijing 100084
*Correspondence author
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Funding: Young Faculty Research Funding of Ministry of Education of China （No.No. 200800031063）, National Key Technology R&D Program of China（No.No. 2008BAH37B02, No. 2008BAH37B04）
Opened online: 6 December 2011
Accepted by: none
Citation: Yao Jiangyuan ,Zhiliang Wang,Xia Yin.Testing of Parallel Parameterized Extended Finite State Machines with Dependence on External Variables[OL]. [ 6 December 2011] http://en.paper.edu.cn/en_releasepaper/content/4452438
 
 
The status of research on model-based testing mainly focus on the model with single component, such as FSM and EFSM. But in some protocols, parallel components with external dependence on variables of other components maybe exist. It is infeasible to precisely specify such protocol by single model. In this paper we extend the Extended Finite State Machine with external variables to form our new model, Parallel Parameterized Extended Finite State Machine (PaP-EFSM), and describe a protocol by a set of PaP-EFSMs. Then we present an approach for tests generation from the new models. Our methodology first use EFSM testing method with minor modifications to generate test sequences for each machine, then we take into account transitions which use external variables or define variables which are used in other machines, and generating final test cases. We apply this method to the conformance testing of Source Address Validation Improvements (SAVI) protocols. A set of PaP-EFSMs are built, there group of test sequences are derived and applied on the 10 devices from 4 manufacturers. Many implement faults are exposed.
Keywords:Protocol Testing; Conformance Testing; Model-Based Testing; Parallel Parameterized Extended Finite State Machines; External Variables
 
 
 

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