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Role of internal stress on dielectric and dc bias field-induced pyroelectric properties of Ba0.68Sr0.32TiO3-(Ba0.68Sr0.32)2TiO4 for uncooled infrared detectors |
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ZHANG Guangzu #,YI Jinqiao *,JIANG Shenglin,YU Yan,HE Jungang,LIU Sisi,ZHU Dingyang,ZHANG Ling
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School of Optical and Electronic Information, Huazhong University of Science and Technology, Wuhan 430074, China
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*Correspondence author |
#Submitted by |
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Subject: |
Funding:
博士点基金(No.20110142120074) |
Opened online:21 May 2013 |
Accepted by:
none |
Citation: ZHANG Guangzu,YI Jinqiao,JIANG Shenglin.Role of internal stress on dielectric and dc bias field-induced pyroelectric properties of Ba0.68Sr0.32TiO3-(Ba0.68Sr0.32)2TiO4 for uncooled infrared detectors[OL]. [21 May 2013] http://en.paper.edu.cn/en_releasepaper/content/4543223 |
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