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Sponsored by the Center for Science and Technology Development of the Ministry of Education
Supervised by Ministry of Education of the People's Republic of China
Detachment of a thin elastic film adhered onto a rigid substrate via van der Waals force is studied in the two-dimensional setting. The film is assumed semi-infite ling and undergoes a peeling force transverse to its edge. By using the modified iteration method, the critical peeling force which gives rise to detachment nucleation from the edge of the film is derived in an analytical form.
Keywords:Detachment initiation; critical peeling force; thin elastic film; van der Waals force