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Nucleation of detachment from the edge of an adhered thin elastic film
HE Linghui * #
Department of Modern Mechanics, University of Science and Technology of China
*Correspondence author
#Submitted by
Subject:
Funding: Ph. D Programs Foundation of the Ministry of Education of China （No.20113402110005）
Opened online: 4 December 2015
Accepted by: none
Citation: HE Linghui.Nucleation of detachment from the edge of an adhered thin elastic film[OL]. [ 4 December 2015] http://en.paper.edu.cn/en_releasepaper/content/4666707
 
 
Detachment of a thin elastic film adhered onto a rigid substrate via van der Waals force is studied in the two-dimensional setting. The film is assumed semi-infite ling and undergoes a peeling force transverse to its edge. By using the modified iteration method, the critical peeling force which gives rise to detachment nucleation from the edge of the film is derived in an analytical form.
Keywords:Detachment initiation; critical peeling force; thin elastic film; van der Waals force
 
 
 

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