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Advanced backend process of CMOS image sensor
Fan Yangyang *
Shanghai Huali Microelectronics Corporation
*Correspondence author
#Submitted by
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Funding: none
Opened online:30 March 2018
Accepted by: none
Citation: Fan Yangyang.Advanced backend process of CMOS image sensor[OL]. [30 March 2018] http://en.paper.edu.cn/en_releasepaper/content/4743710
 
 
This paper improved backend process of CMOS image sensor (CIS) which developed from 55nm CMOS manufacturing process in order to improve the imaging results. There are two implementation methods: One is adding deep trench process (DT) after the aluminum process (AL).The other is adding NDC(nitride doped carbon) Remove process after the deposition of NDC of every metal layer. Both methods can form the optical channel and achieve the requirements of devices.
Keywords:CIS, Advance Process, 4T, Deep trench process, NDC
 
 
 

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