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Size dependence of acoustic, dielectric and photoelectronic behaviour of nanosolid silicon
Sun Changqing * #
Nanyang Technological University
*Correspondence author
#Submitted by
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Funding: none
Opened online:26 July 2005
Accepted by: none
Citation: Sun Changqing.Size dependence of acoustic, dielectric and photoelectronic behaviour of nanosolid silicon[OL]. [26 July 2005] http://en.paper.edu.cn/en_releasepaper/content/2532
 
 
Structural miniaturization provides us with a new freedom that is indeed fascinating. The new freedom of size not only allows us to tune the physical and chemical properties of a specimen by simply adjusting the shape and size but also enables us to gain information that is beyond the scope of conventional approaches. Here we show that a recent bond order-length-strength (BOLS) correlation could reconcile the size effect on nanosolid silicon with elucidation of information such as the single energy level of an isolated Si atom, the frequency of Si-Si dimer vibration, the upper limit of photoabsorption/emission, and dielectric suppression.
Keywords:Photoemission, photoabsorption, porous silicon, dielectrics, acoustic phonons and optical phonons
 
 
 

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