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1. Evaluation of interfacial properties in SiC composites using an improved cohesive element method | |||
ZANG Hang,CAO Xingqing,HE Chaohui,HUANG Zhisheng,LI Yonghong | |||
Nuclear Science and Technology 17 April 2017 | |||
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Abstract:A two-dimensional axisymmetric finite element model based on an improved cohesive element method was developed to simulate the the interfacial debonding, the sliding friction and residual thermal stresses of SiC composites during single fiber push-out test to extract the interfacial bond strength and frictional stress. The numerical load-displacement curves agree well with the experimental curves, indicating that this cohesive element can be used for calculating the interfacial properties of SiC composites. The simulation results show that the crack is most likely to occur at both ends of the experiment, where the maximum shear stress is observed, and the interfacial shear strength and the constant sliding friction stress decrease with an increase of temperature. Moreover, the load required to cause a complete failure of the interface is with the increase of shear strength and composite material with higher fiber volume fraction has stronger bearing capacity. In addition, the initial failure load becomes stronger with an increase of interphase thickness. | |||
TO cite this article:ZANG Hang,CAO Xingqing,HE Chaohui, et al. Evaluation of interfacial properties in SiC composites using an improved cohesive element method[OL].[17 April 2017] http://en.paper.edu.cn/en_releasepaper/content/4725456 |
2. Tuning porous silica films by various surfactants and loading: A study of positron annihilation Doppler broadening based on a slow positron beam | |||
XIONG Bangyun,MAO Wenfeng,HE Chunqing | |||
Nuclear Science and Technology 25 October 2012 | |||
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Abstract:Porous silica films were synthesized via a sol-gel method using a nonionic amphiphilic triblock copolymer (F127) and a cationic surfactant (CTAB) as the structural templates with varying weight ratio. Positron annihilation Doppler broadening spectroscopy based on a slow positron beam was used to study the prepared silica films. For the porous silica films, the S parameter increased gradually with increasing the surfactant loading, which showed that larger pores were introduced in the silica films with more porogen. Distinct difference was observed for the W parameter of the same silica film templated by CTAB after rotating it by 90 around the positron beam axis, indicative of ordered tubal pores aligning along the film surface. | |||
TO cite this article:XIONG Bangyun,MAO Wenfeng,HE Chunqing. Tuning porous silica films by various surfactants and loading: A study of positron annihilation Doppler broadening based on a slow positron beam[OL].[25 October 2012] http://en.paper.edu.cn/en_releasepaper/content/4492969 |
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