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1. SPR phase detection for measuring the thickness of different thin metal films | |||
Liu Chao,Yue Chong,Qin Zirui,Liu Qinggang | |||
Physics 19 January 2018 | |||
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Abstract:In this paper, a novel method to determine the thickness of different thin metal film is put forward which uses Surface Plasmon Resonance (SPR) phase detection method. The relations between the metal film thickness and the phases of the transverse magnetic (TM) and transverse electric (TE) polarization of the reflected light are shown in the simulation results. By recording the interference patterns which contain the information of the phase differences in the experiments, the values of thickness are calculated. Both of the theoretical analysis and experimental results indicate that the approach presented is feasible and reliable. Thus, it is possible to use the method of phase detection to determine the thickness of different thin metal films in SPR prism couplers directly with nanometer resolution. | |||
TO cite this article:Liu Chao,Yue Chong,Qin Zirui, et al. SPR phase detection for measuring the thickness of different thin metal films[OL].[19 January 2018] http://en.paper.edu.cn/en_releasepaper/content/4743065 |
2. SPR Phase Detection for Measuring the Thickness of Bimetallic Layers' Film | |||
Liu Chao,Yue Chong,Qin Zirui,Liu Qinggang | |||
Physics 13 January 2018 | |||
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Abstract:In this paper, the phase detection method is demonstrated to determine the films thicknesses of bimetallic layers by Surface Plasmas Resonance (SPR) prism coupler. It was proposed and developed by matching the experimental results to the theoretical curves of the phase difference with different angles of incidence. Theoretical analysis and experimental results indicate that the method proposed is stable and reliable, and feasible to be used to determine the film thickness of bimetallic layers directly with nanometer order resolution. | |||
TO cite this article:Liu Chao,Yue Chong,Qin Zirui, et al. SPR Phase Detection for Measuring the Thickness of Bimetallic Layers' Film[OL].[13 January 2018] http://en.paper.edu.cn/en_releasepaper/content/4743064 |
3. Effects of static surface charges on propagation direction of electromagnetic waves | |||
Chen Jiangwei,Lu Huaixian | |||
Physics 13 November 2009 | |||
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Abstract:In this paper, we demonstrate that, based upon boundary conditions and the uniqueness theorem of domain decomposition method for boundary problem of Helmholtz equation, Snell’s law may also be derived without adopting phase-matching condition. Similarly, direction relationship between obliquely incident TM wave and the transmitted one including term of surface charge density are otbained. Numerical simulation results show that surface charges may divide the obliquely incident TM wave into two branches, distribution of time-averaged Poynting flow of the transmitted wave versus refraction angle depend on surface charge density, wave impedances of the two media and amplitude of electric field, respectively. | |||
TO cite this article:Chen Jiangwei,Lu Huaixian. Effects of static surface charges on propagation direction of electromagnetic waves[OL].[13 November 2009] http://en.paper.edu.cn/en_releasepaper/content/36657 |
4. Inverse source model for nonparaxial diode lasers | |||
Cao Changqing ,Zeng Xiaodong ,An Yuying | |||
Physics 27 March 2006 | |||
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Abstract:Based on the off-axis theory and a far-field rigorous solution of the Helmholtz equation, by using the angular spectrum representation, the Fourier transform and the inverse Fourier transform, an inverse source model for nonparaxial diode lasers has been obtained. This model has a simple mathematical structure and can be easily used to solve the inverse source problem rigorously with the far-field measured data. So the accurate analytical solution to the source distribution can be obtained with the far-field intensity distribution, and then the parameters relating to the waveguide structure can be obtained. | |||
TO cite this article:Cao Changqing ,Zeng Xiaodong ,An Yuying . Inverse source model for nonparaxial diode lasers[OL].[27 March 2006] http://en.paper.edu.cn/en_releasepaper/content/5933 |
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