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	1. A Superconducting Wide-Band Filter Subsystem with Improved Out-of-Band Performance
	Chen Wei,Chen Yidong,Guo Xubo,Cao Bisong,Zhang Xiaoping,Wei Bin,Jiang Linan
	Electrics, Communication and Autocontrol Technology 02 February 2012
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	Abstract:A High-temperature superconducting (HTS) wide-band filter subsystem, consisting of an HTS filter and a cryogenic low noise amplifier (CLNA), is presented. The HTS filter at 480 MHz with an 86 MHz bandwidth is designed using stepped impedance resonators to achieve a high out-of-band performance and a compact size. The deterioration of the out-of-band rejection after cascading the HTS filter with the CLNA is addressed and solved. The measurements of the filter subsystem, without any tuning, exhibit an excellent performance. The gain is 16.3 ± 0.2 dB, the noise figure is less than 0.35 dB, and the return loss is better than 15.6 dB. The out-of-band rejection is over 78 dB up to 1230 MHz, which is 2.6 times of the filter's center frequency.
	TO cite this article:Chen Wei,Chen Yidong,Guo Xubo, et al. A Superconducting Wide-Band Filter Subsystem with Improved Out-of-Band Performance[OL].[ 2 February 2012] http://en.paper.edu.cn/en_releasepaper/content/4464866


	2. CMOS IC DESIGN FOR RELIABILITY - A REVIEW
	Kuang Wei
	Electrics, Communication and Autocontrol Technology 20 November 2009
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	Abstract:The negative bias temperature instability (NBTI), gate oxide breakdown (BD), and HCI (hot carrier injection) are the major wear-out effects on the Complementary Metal Oxide Semiconductor (CMOS) integrated circuit reliability as the CMOS device becomes smaller, especially in the nanoscale size. This paper summarizes much of the recently developed research about the CMOS integrated circuit (IC) design for reliability: from physical level to the circuit level. The tools and algorithm for the CMOS IC design for reliability are also summarized in this paper. It surveys the crucial topics of the CMOS IC design for reliability and the technology to improve the circuit robustness to the wear-out effects.
	TO cite this article:Kuang Wei. CMOS IC DESIGN FOR RELIABILITY - A REVIEW[OL].[20 November 2009] http://en.paper.edu.cn/en_releasepaper/content/36894


	3. Exact Design of Evanescent-Wave Amplication Using Bilayer Periodic Circuit Structures
	Xianqi Lin,Huifeng Ma,Ruopeng Liu,Qiang Cheng,Tiejun Cui
	Electrics, Communication and Autocontrol Technology 18 January 2008
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	Abstract:An efficient method is presented to design the evanescent wave amplification exactly by cascading two layers of periodic series-shunt capacitors and and inductors, which simulate a bilayer of magnetic and electric plasmas. Based on the presented method, equivalent lumped parameters of circuit structures are retrieved, from which the evanescent-wave amplification (EWA) is obtained at a designed frequency. Full-wave simulations show that the relative offset of the EWA frequency is less than 0.1%. The structure has been fabricated and measured, and the measurement results have good agreements with the simulation results. The proposed method can be used to design other periodic circuit structures, and the exact design of EWA can be used in the fabrication of novel components.
	TO cite this article:Xianqi Lin,Huifeng Ma,Ruopeng Liu, et al. Exact Design of Evanescent-Wave Amplication Using Bilayer Periodic Circuit Structures[OL].[18 January 2008] http://en.paper.edu.cn/en_releasepaper/content/18211


	4. Fast and accurate simulations of transmission-line metamaterials using transmission-matrix method
	Huifeng Ma,Tiejun Cui,Yao Qin,Qiang Cheng
	Electrics, Communication and Autocontrol Technology 25 December 2007
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	Abstract:Recently, two-dimensional (2D) periodically L and C loaded transmission-line (TL) networks have been applied to represent metamaterials. The commercial Agilent’s Advanced Design System (ADS) is a commonly-used tool to simulate the TL metamaterials. However, it takes a lot of time to set up the TL network and perform numerical simulations using ADS, making the metamaterial analysis inefficient, especially for large-scale TL networks. In this paper, we propose transmission-matrix method (TMM) to simulate and analyze the TL-network metamaterials efficiently. Compared to the ADS commercial software, TMM provides nearly the same simulation results for the same networks. However, the model-process and simulation time has been greatly reduced. The proposed TMM can serve as an efficient tool to study the TL-network metamaterials.
	TO cite this article:Huifeng Ma,Tiejun Cui,Yao Qin, et al. Fast and accurate simulations of transmission-line metamaterials using transmission-matrix method[OL].[25 December 2007] http://en.paper.edu.cn/en_releasepaper/content/17364


	5. Multi-mode Coupling in a Coaxial Bragg Reflector
	Lai Ying-Xin,Zhang Shi-Chang
	Electrics, Communication and Autocontrol Technology 29 June 2007
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	Abstract:A comprehensive theory is presented to analyze the multi-mode coupling in a coaxial Bragg reflector, including the derivation of the coupled equations, the coupling coefficient and the attenuation coefficient of the multi modes. Numerical study illustrates attractive peculiarities of a coaxial Bragg reflector with both the outer wall and the inner rod corrugated: the operating mode can get strong reflectivity and the spurious modes are well suppressed, even if the reflector with large dimensional size operates in higher-order mode at hundreds of GHz.
	TO cite this article:Lai Ying-Xin,Zhang Shi-Chang . Multi-mode Coupling in a Coaxial Bragg Reflector[OL].[29 June 2007] http://en.paper.edu.cn/en_releasepaper/content/13787


	6. The aberration theory of a combined electron focusing-deflection system with a rotating deflection field following the rotation of the electrons
	Yan Ren,Tiantong Tang,Yongfeng Kang,Xiaoli Guo
	Electrics, Communication and Autocontrol Technology 19 December 2005
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	Abstract: A new type of combined electron focusing-deflection system is proposed, in which the orientation of the deflection field is rotated following the rotation of the electrons caused by the magnetic lens field. The deflection direction rotated electrical deflectors can be constructed by using TWE (tube wall electrode) systems. Formulae are derived for the first-order optical properties, third order geometrical aberrations and first-order chromatic aberrations of this system. A program was written in FORTRAN for numerical computation. An example is given; the computation results show that compared to the conventional systems, the proposed new system has lower deflection aberration coefficients.
	TO cite this article:Yan Ren,Tiantong Tang,Yongfeng Kang, et al. The aberration theory of a combined electron focusing-deflection system with a rotating deflection field following the rotation of the electrons[OL].[19 December 2005] http://en.paper.edu.cn/en_releasepaper/content/4475

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